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Federal Institute of Metrology
Federal Institute of Metrology
Contacts: Johannes.hoffmann@metas.ch
Web-site: www.metas.ch
LAB and RESEARCH
LAB and RESEARCH
RF & Microwave Laboratory
RF & Microwave Laboratory
The RF & Microwave laboratory at the Federal Institute of Metrology METAS offers measurement services in S-parameters, RF power, Noise and scanning microwave microscope measurements (SMM). The SMM is an instrument suited to measure characterize the electrnic properties of the first micrometer of battery electrodes.
EXPERIMENTAL EQUIPMENT
EXPERIMENTAL EQUIPMENT
JACOMEX Glovebox for operation of SMM in inert atmosphere
A full cylinder von Hamos geometry X-ray emission spectrometer with an integrated glovebox for handling samples under inert conditions is available for ex situ and post mortem investigations of electrodes. Changes in the electronic structure of 3D transition metals can be targeted to monitor changes in pristine materials and during battery cycling. The spectrometer was developed in collaboration with the Berlin Laboratory for Innovative X-ray technologies and is equipped with highly annealed pyrolytic graphite optics, which, in combination with the full-cylinder configuration, optimizes the instrument's detection efficiency. A liquid metal jet coupled with polycapillary optics is used to efficiently excite a selected element, making valence-to-core transitions accessible. These transitions are characterized by low probability, but provide insight into ligand identity and bond length.
EXAFS spectrometer
SP 300 Potentiostat for controlling electrochemical potential in half cells during measurements with the scanning microwave microscope
SP-300 Potentiostat
SP 300 Potentiostat for controlling electrochemical potential in half cells during measurements with the scanning microwave microscope
PEOPLE and LIFE
PEOPLE and LIFE
Researcher
Hoffmann Johannes
Hoffmann Johannes
Johannes Hoffmann received the Dipl.Ing. degree in electrical engineering from the University of Stuttgart, Stuttgart, Germany, in 2005, the Ing. degree from the École Nationale Supérieure des Télécommunications (ENST), Paris, France, in 2005, in the course of a double diploma program, and the Ph.D. degree from ETH Zürich, Zürich, Switzerland, in 2009.
He is currently with the Laboratory for RF and MW, Swiss Federal Institute of Metrology (METAS), Bern, Switzerland. His research interests include scanning microwave microscopy and general RF and microwave measurements that involve electromagnetics, uncertainty calculation, and numerical modeling.
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