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Federal Institute of Metrology (METAS)
Federal Institute of Metrology (METAS)
Contacts: Johannes Hoffmann, Johannes.hoffmann@metas.ch
Web-site: www.metas.ch
LAB and RESEARCH
LAB and RESEARCH
Federal Institute of Metrology METAS at Bern-Wabern in Switzerland
Federal Institute of Metrology METAS at Bern-Wabern in Switzerland
The RF & Microwave laboratory at the Federal Institute of Metrology METAS offers measurement services in S-parameters, RF power, Noise and scanning microwave microscope measurements (SMM). The SMM is an instrument suited to measure characterize the electrnic properties of the first micrometer of battery electrodes
EXPERIMENTAL EQUIPMENT
EXPERIMENTAL EQUIPMENT
JACOMEX Glovebox for operation of SMM in inert atmosphere
In this JACOMEX glovebox humidity and oxygen levels are kept below 1ppm to ensure the degradation free handling and measurement of battery samples containing metals such as lithium or natrium. The glovebox contains mechanical feedthroughs which enable continuous operation of the scanning microwave microscope inside while the circulation in the glovebox is switched on and the atmosphere is kept constant.
SP-300 Potentiostat
SP 300 Potentiostat for controlling electrochemical potential in half cells during measurements with the scanning microwave microscope
Scanning microwave microscope
Drive SMM from Nanosurf for AFM and SMM characterization of battery electrodes in dry and ambient conditions.
PEOPLE and LIFE
PEOPLE and LIFE
Dr Johannes Hoffmann
Johannes Hoffmann
Johannes Hoffmann
Johannes Hoffmann received the Dipl.Ing. degree in electrical engineering from the University of Stuttgart, Stuttgart, Germany, in 2005, the Ing. degree from the École Nationale Supérieure des Télécommunications (ENST), Paris, France, in 2005, in the course of a double diploma program, and the Ph.D. degree from ETH Zürich, Zürich, Switzerland, in 2009.
He is currently with the Laboratory for RF and MW, Swiss Federal Institute of Metrology (METAS), Bern, Switzerland. His research interests include scanning microwave microscopy and general RF and microwave measurements that involve electromagnetics, uncertainty calculation, and numerical modeling.
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